Keysight Technologies Inc. Parametric Test System Controller
The Keysight N9171C is a Parametric Test System Controller designed as part of Keysight's N9100 Series for semiconductor device characterization and parametric testing. It provides advanced automation and control capabilities for parametric test systems, enabling precise measurement and analysis of semiconductor parameters. The N9171C integrates seamlessly with Keysight's parametric test solutions, offering robust performance, high reliability, and compatibility with a range of test instruments. It is engineered to support demanding test environments, ensuring accurate data acquisition and efficient workflow management for semiconductor manufacturing and research applications.