Keysight Technologies Inc. PathWave Semiconductor Test, Online, Silicon Photonics Parametric Wafer Test
The Keysight NX2051WA is part of the PathWave Semiconductor Test software suite, specifically designed for online silicon photonics parametric wafer testing. This solution enables automated, high-throughput electrical and optical parametric testing of silicon photonics wafers, supporting advanced device characterization and process monitoring. It integrates with Keysight's measurement instruments and automation systems, providing a scalable platform for R&D and production environments. The software offers comprehensive data analysis, customizable test sequencing, and seamless connectivity to laboratory information management systems (LIMS), ensuring efficient workflow and reliable test results for silicon photonics device manufacturers.