Keysight Technologies Inc. Silicon Photonics Wafer Test System Solution Set
The Keysight NX5402A Silicon Photonics Wafer Test System Solution Set is part of the NX5400 Series, designed to enable high-throughput, automated wafer-level testing of silicon photonics devices. This solution set integrates optical and electrical test capabilities, supporting parallel testing to accelerate device characterization and improve yield analysis. The NX5402A is engineered for compatibility with advanced wafer probers and provides precise alignment and measurement for optical components. It is suitable for R&D and production environments, offering scalable architecture and comprehensive software tools for data analysis and test automation. The system is optimized for reliability and repeatability in demanding photonics manufacturing workflows.