Keysight Technologies Inc. High Throughput 1 ns Pulsed IV Memory Test Solution
The Keysight NX5730A is part of the NX5700A Series and is a high throughput 1 ns pulsed IV memory test solution designed for advanced semiconductor device characterization. It enables precise, high-speed pulsed current-voltage (IV) measurements with pulse widths as short as 1 nanosecond, making it suitable for evaluating next-generation memory devices such as DRAM, NAND, and emerging non-volatile memory technologies. The NX5730A offers high measurement accuracy, fast test times, and supports automated test environments, helping accelerate device development and improve yield analysis. It integrates seamlessly with Keysight's PathWave software for data analysis and test automation.