Keysight Technologies Inc. Parametric Test System Controller
The Keysight NX6001A-N9171C-ATO is a configuration within the NX6000 Series Parametric Test System Controllers, designed to provide advanced automation and control for semiconductor parametric testing. This system controller integrates seamlessly with Keysight's parametric test solutions, offering high throughput, precise measurement capabilities, and robust data management. It supports a wide range of test applications, including device characterization and process monitoring, and is engineered for reliability in demanding production environments. The NX6001A-N9171C-ATO enables efficient test execution, flexible system integration, and comprehensive test data analysis, ensuring optimal performance and scalability for semiconductor manufacturing and R&D labs.