Keysight Technologies Inc. Parametric Test System Controller
The Keysight NX6002A-N9171C-ATO is a configuration of the NX6002A Parametric Test System Controller, designed for advanced semiconductor device characterization and parametric testing. As part of Keysights PathWave Test platform, the NX6002A controller provides high-speed, high-accuracy measurement capabilities, supporting automated test environments for wafer-level and device-level analysis. It integrates seamlessly with Keysights parametric measurement units and software, enabling flexible test sequencing, data management, and analysis. The system controller is engineered for reliability and scalability, supporting a wide range of test applications in R&D and production. It is compatible with various Keysight parametric instruments and accessories, ensuring comprehensive test coverage and efficient workflow integration.