Keysight Technologies Inc. Keysight PX9002A Parallel Parametric Test System
The Keysight NX6002A is a member of the NX6000 Series parametric test systems, designed for advanced semiconductor device characterization and process control. It offers high-throughput, fully automated parametric testing with flexible configuration options to support a wide range of wafer types and test requirements. The NX6002A integrates seamlessly with Keysight's measurement instruments and software, providing precise electrical measurements, robust data management, and compatibility with industry-standard automation interfaces. Its modular architecture allows for scalability and customization, making it suitable for both R&D and high-volume manufacturing environments.