Keysight Technologies Inc. Parallel parametric online software package
The Keysight NX6031LA Parallel Parametric Online Software Package is designed for use with the NX6000 Series Parametric Test Systems. This software enables parallel parametric testing, allowing users to perform simultaneous measurements on multiple devices or test sites, thereby increasing throughput and efficiency in semiconductor wafer testing environments. The NX6031LA supports advanced data analysis, real-time monitoring, and integration with automated test equipment. It is optimized for high-volume manufacturing and provides robust tools for test management, data collection, and result visualization, ensuring reliable and repeatable parametric measurements.