Keysight Technologies Inc. Keysight P9001A Massively Parallel Parametric Test System
The Keysight P9001A Massively Parallel Parametric Test System is designed for high-throughput semiconductor device characterization and process control. It enables simultaneous testing of up to 48 devices in parallel, significantly increasing test efficiency and reducing overall test time. The system integrates advanced measurement capabilities, including low-leakage switching, high-precision source/measure units, and flexible probe card interfaces. The P9001A supports a wide range of parametric measurements such as current-voltage (IV), capacitance-voltage (CV), and time-dependent dielectric breakdown (TDDB). Its modular architecture allows for easy scalability and customization to meet specific wafer test requirements. The system is fully compatible with Keysight's PathWave Test Executive for automated test sequencing and data analysis, ensuring seamless integration into existing test environments.