Keysight Technologies Inc. PathWave IC-CAP GaN Model Extraction Package Plus
The Keysight W7013E PathWave IC-CAP GaN Model Extraction Package Plus is a comprehensive software solution designed for the extraction and modeling of Gallium Nitride (GaN) devices. It provides advanced tools for parameter extraction, model validation, and simulation, supporting industry-standard compact models such as ASM-HEMT and Angelov. The package enables users to efficiently characterize GaN HEMT devices, automate measurement and extraction workflows, and ensure accurate device modeling for RF and power applications. It integrates seamlessly with Keysight measurement instruments and supports a wide range of modeling tasks, from DC to RF, facilitating robust device characterization and model development.