Marvin Test Solutions Inc. Dynamic Digital I/O (3U), 32 ch., per Pin Control, up to 100 MHz w/256MB Memory & LVDS
Dynamically Controlled High Speed Digital I/O PXI Card
The GX5292 from Marvin Test Solutions is a 3U PXI dynamic digital I/O instrument featuring 32 channels with per-pin control. It supports data rates up to 100 MHz and is equipped with 256 MB of vector memory. The GX5292 provides LVDS (Low Voltage Differential Signaling) I/O levels, making it suitable for high-speed digital functional test applications. Each channel can be independently programmed for input, output, or bidirectional operation, and the instrument supports advanced features such as per-pin timing, programmable voltage levels, and flexible pattern sequencing. The GX5292 is designed for use in automated test systems requiring precise digital stimulus and response capabilities, and it is compatible with Marvin Test Solutions' software tools for pattern development and execution.