National Instruments Corporation PROBE TOWER FOR NI STS (8 MODULE)
The PROBE TOWER FOR NI STS (8 MODULE), part number 159588-02, is an official accessory designed by National Instruments for use with the NI Semiconductor Test System (STS). This probe tower accommodates up to eight instrument modules, providing a scalable and modular solution for semiconductor device testing. It is engineered to integrate seamlessly with the NI STS platform, supporting high-density instrumentation and efficient signal routing. The probe tower ensures reliable mechanical and electrical connections between the test system and the device under test, facilitating automated and high-throughput test environments. Its robust construction and compatibility with NI STS modules make it suitable for demanding semiconductor production and validation applications.