National Instruments Corporation STS RF Eval DIB, Up to 64 SMP Ports
The National Instruments STS RF EVAL DIB, part number 788273-01, is a Device Interface Board (DIB) designed for use with the NI Semiconductor Test System (STS) platform. This DIB supports evaluation and development for RF semiconductor devices and is capable of interfacing with up to 64 SMP ports, enabling high-density, high-frequency signal connections. The board is engineered to facilitate rapid prototyping and validation of RF test solutions, providing reliable connectivity and signal integrity for advanced semiconductor testing applications. It is intended for use in automated test environments where flexibility and scalability are required.