National Instruments Corporation STS RF Eval DIB, Up to 64 SMP and 80 SMPM Ports
The National Instruments 788274-01 is an STS RF Evaluation Device Interface Board (DIB) designed for use with the NI Semiconductor Test System (STS). This DIB supports up to 64 SMP and 80 SMPM ports, enabling high-density RF signal routing for advanced semiconductor device testing. It is engineered to facilitate evaluation and characterization of RF devices by providing reliable, high-frequency connections between the device under test (DUT) and the STS instrumentation. The board is optimized for signal integrity and repeatability, supporting a wide range of RF test applications in semiconductor validation and production environments. The 788274-01 is compatible with NI's modular STS platform, allowing for flexible configuration and integration into automated test setups. This DIB is intended for use by engineers and technicians requiring robust, scalable RF test solutions for complex semiconductor devices.