788275-01 - National Instruments Corporation STS Mixed Signal Eval DIB

National Instruments Corporation STS Mixed Signal Eval DIB

The National Instruments 788275-01 is the STS Mixed Signal Evaluation Device Interface Board (DIB), designed for use with the NI Semiconductor Test System (STS) platform. This DIB enables evaluation and characterization of mixed-signal devices by providing the necessary interface between the device under test (DUT) and the STS test instrumentation. It supports flexible signal routing and connectivity, allowing engineers to efficiently validate mixed-signal ICs in a production test environment. The board is engineered for compatibility with STS handlers and sockets, ensuring reliable and repeatable test results.