National Instruments Corporation STS RF Eval DIB, Up To 176 Ports With 2x10 Position Ganged RF Cables
The National Instruments 789487-01 is an STS RF Evaluation Device Interface Board (DIB) designed for use with the NI Semiconductor Test System (STS). This DIB supports up to 176 ports and features two 10-position ganged RF cables, enabling high-density RF signal routing for advanced semiconductor device testing. The board is engineered to facilitate rapid evaluation and characterization of RF devices, providing reliable connectivity and signal integrity for demanding test environments. It is compatible with NI's modular STS platform, supporting flexible test configurations and efficient device handling.