National Instruments Corporation RH-5460 2 Channel Remote Head Ultra-Fast Parametric I-V Measurement Device
The National Instruments RH-5460 is a 2-channel remote head ultra-fast parametric I-V measurement device designed for high-speed, high-accuracy current-voltage characterization. It features two independent channels, each capable of sourcing and measuring voltage and current with sub-microsecond timing resolution. The RH-5460 is engineered for integration with NI's PXIe SMU systems, enabling advanced semiconductor device testing and characterization. Its remote head architecture minimizes cable parasitics and improves measurement fidelity, making it suitable for demanding applications such as wafer-level testing, reliability analysis, and device modeling. The device supports flexible triggering and synchronization with other test instruments, and is fully compatible with NI's software platforms for automated test and data analysis.